Abstract This investigation delves into the complex interaction at metal-semiconductor interfaces. highlighting the magnetic proximity effect in Ni/Si interfaces through systematic X-ray magnetic circular dichroism (XMCD) studies at Ni and Si edges. We analyzed two Ni/Si heterostructures with differing semiconductor doping. uncovering a magnetic proximity effect manifesting as equilib... https://www.plataformalabcc.com/product-category/feature/